ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,562,685, issued on Feb. 24, was assigned to SEIKO EPSON Corp. (Japan). "Circuit device and oscillator" was invented by Yosuke Itasaka (Minowa, ... Read More
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,558,290, issued on Feb. 24, was assigned to METABRAIN TECHNOLOGY PTE. LTD. (Singapore) and ZHUHAI ULOOK METABRAIN MEDICAL TECHNOLOGY Co. LTD. (Z... Read More
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,563,887, issued on Feb. 24, was assigned to Beijing BOE Technology Development Co. Ltd. (Beijing) and BOE TECHNOLOGY GROUP Co. LTD. (Beijing). ... Read More
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,558,584, issued on Feb. 24, was assigned to Johnson Health Tech Co. Ltd. (Taichung City, Taiwan). "Resistance adjustment device of exercise app... Read More
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,561,350, issued on Feb. 24, was assigned to CLASSUM Co. Ltd. (Seoul, South Korea). "Method of recommending similar question, and computing devi... Read More
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,559,970, issued on Feb. 24, was assigned to SACS Aerospace GmbH (Empfingen, Germany). "Latch" was invented by Andreas Rapp (Dornhan, Germany) a... Read More
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,561,719, issued on Feb. 24, was assigned to EDATANETWORKS INC. (Calgary, Canada). "System and methods for changing operation modes in a loyalty... Read More
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,561,095, issued on Feb. 24, was assigned to Micron Technology Inc. (Boise, Idaho). "Transferring valid data using a system latch" was invented ... Read More
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,558,052, issued on Feb. 24, was assigned to Sino Canada Health Institute Inc. (Hefei, China). "Method for monitoring PET readout positions usin... Read More
ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,869, issued on Feb. 24, was assigned to ASML NETHERLANDS B.V. (Veldhoven, Netherlands). "Inspection tool, method and lithographic apparatus... Read More